Hong jin Fully Automatic Separate Steam Chamber Semiconductor Chip Climatic HAST High Pressure Accelerated Aging Tester

Hong jin Fully Automatic Separate Steam Chamber Semiconductor Chip Climatic HAST High Pressure Accelerated Aging Tester (also known as HAST high voltage accelerated aging testing machine) test purpose is to improve the environmental stress (such as: temperature) and working stress (applied to the product voltage, load, etc.), speed up the test process, shorten the life test time of the product or system, for investigating and analyzing when electronic components
appear. The problems of wear and service life of mechanical parts, the shape of the fault distribution function of the service life, and the tests carried out to analyze the reasons for the rise in the failure rate.